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TTTC's Electronic Broadcasting
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XXXIII Conference on Design of
Circuits and Integrated Systems |
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CALL FOR PAPERS
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The conference on Design of Circuits and Integrated Systems (DCIS) is an international meeting for researchers in the highly active fields of micro- and nano-electronic circuits and integrated systems. It provides an excellent forum to present and discuss works on the emerging challenges offered by technology, in the areas of modeling, design, implementation and test of devices, circuits and systems. The 33rd edition will be organized at CPE in “La Doua” campus located 20 minutes from the heart of downtown Lyon, a world UNESCO heritage site. New topics related to emerging technologies, security and new computing paradigms and hardware such as Machine Learning will be included. We encourage submission of manuscripts (IEEE single-spaced, double-column, A4 page, 6 pages maximum) on the following or related topics:
The following 3 keynotes are scheduled :
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All papers must be IEEE single-spaced, double-column, A4 page, 6 pages maximum. Accepted papers with at least one registered author and signed copyright will be published on IEEEXplore. Best papers will be considered for publication in a journal. We also encourage the submission of Special Sessions. Please contact the special session chair (david.navarro@ec-lyon.fr) before May 1st . Already scheduled special sessions cover the following topics: networked embedded systems, NVRAM, biomedical, security.
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Technical papers
On-line Registration July 15th to November 15th Early registration deadline: October 15th |
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| Additional Information | |
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Submissions and further info: www.dcis.org |
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| Committee | |
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General Co-Chairs
Program Chair
Special Sessions and Tutorial Chair
Local Committee
International Committee IEEE Liaisons
Steeering Committee
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For more information, visit
us on the web at: www.dcis.org
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DCIS is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE Computer Society-Test
Technology Technical Council
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